Journal Publications


    (25) 24. M. Rumbak; I. Visloy-Fisher; R. Shikler ,Broadband absorption enhancement via light trapping in periodically patterned polymeric solar cells Accepted to J. Appl. Phys. IF 2.079 Q1

    (24) Sudheendran Mavila, Charles E. Diesendruck, Sivan Linde, Liron Amir, Rafi Shikler, and N. Gabriel Lemcoff (2013) Polycyclooctadiene Complexes of Rhodium(I): Direct Access to Organometallic Nanoparticles Issue Angewandte Chemie 52(22),5767-5770 (2013) [PDF]

    (23) Antonio Carella , Fabio Borbone , Antonio Roviello , Giuseppina Roviello , Angela Tuzi , Alexey Kravinsky , Rafi Shikler , Giovanni Cantele, Domenico Ninno (2012) Benzodifuroxazinones, a new class of heteroacene molecules for possible applications in organic electronics: Synthesis, electronic properties and crystal structure Dyes and Pigments 95, 116e125 (2012) [PDF]

    (22) Sivan Linde, Antonio Carella, and Rafi Shikler (2012) New Approach for Analyzing the Vertical Structure of Polymer Thin Films Based on Surface-Enhanced Raman Scattering Macromolecules 45, 1476?1482 (2012) [PDF]

    (21) 20. Shikler R. and Rosenwaks Y. (2010) Response to "Comment on 'Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy' Appl. Phys. Lett. 96, 216102 (2010)

    (20) Marianna Korzhov, David Andelman, Rafi Shikler (2008) Dreaming in plastic Physics World 29 (2008) [PDF]

    (19) Rafi Shikler and Richard H. Friend (2007) Modeling the effect of the structure of polymer photocells on their absorption spectrum Journal of Applied Physics 102, 013105 (2007) [PDF]

    (18) 18. Rafi Shikler and R. H. Friend (2007) Absorption Enhancement in Polymer Photocells using Periodic structures J. Appl. Phys. 102, 013105 (2007)

    (17) Rafi Shikler, Marco Chiesa, and Richard H. Friend (2006) Photovoltaic Performance and Morphology of Polyfluorene Blends: The Influence of Phase Separation Evolution Macromolecules 39 ,5393-5399 (2006) [PDF]

    (16) Y. Rosenwaks and R. Shikler (2004) Kelvin probe force microscopy of semiconductor surface defects Phys. Rev. B 70, 085320 (2004) [PDF]

    (15) Marco Chiesa, Lukas Bu1rgi,? Ji-Seon Kim, Rafi Shikler, Richard H. Friend, and Henning Sirringhaus* (2004) Correlation between Surface Photovoltage and Blend Morphology in Polyfluorene-Based Photodiodes Nano Letters 5(4) ,559-563 (2005) [PDF]

    (14) 14. Duhayon N., Eyber P., Fouchier M., Clarysee, T., Vandervorst W., Alvarez D., Schoemann S., Ciappa M., Stangoni M., Fichtner W., Formanek P., Kittler M., Raineri V., Giannazzo, F., Goghero D., RosenwaksY., Shikler R., Saraf S., Sadewasser S., Barreau N., Glatzel T., Verheijen M., Mentink S. A. M.; von Sprekelsen M., Maltezopoulos T., Wiesendanger R., Hellemans L. (2004) Assessing the performance of two-dimensional dopant profiling techniques J. Vacuum. Sci. Technol. B., 22, 385 (2004)

    (13) Th. Glatzel , S. Sadewasser , R. Shikler , Y. Rosenwaks , M.Ch. Lux-Steiner (2003) Kelvin probe force microscopy on III/V semiconductors: the effect of surface defects on the local work function Materials Science and Engineering B102, 138-142 (2003) [PDF]

    (12) S. Sadewassera, Th. Glatzela, R. Shiklerb, Y. Rosenwaksb, M.Ch. Lux-Steinera (2003) Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation Applied Surface Science 210, 32-36 (2003) [PDF]

    (11) G. Lubarsky, R.Shikler, N. Ashkenasy, and Y. Rosenwaks (2002) Quantitative evaluation of local charge trapping in dielectric stacked gate structures using Kelvin probe force microscopy J. Vacuum. Sci. Technol. B.,20 1914 (2002) <

    (10) S. Saraf, R. Shikler, J. Yang, and Y. Rosenwaksa) (2002) Microscopic surface photovoltage spectroscopy Applied Physics Letters 80, 2586 - 2588 (2002) [PDF]

    (9) M. Shvebelman, P. Urenski, R. Shikler, G. Rosenman, and Y. Rosenwaksa (2002) Scanning probe microscopy of well-defined periodically poled ferroelectric domain structure Applied Physics Letters 80, 1806 - 1808 (2002) [PDF]

    (8) R. Shikler , Y. Rosenwaks (2000) Kelvin probe force microscopy using near-field optical tips Applied Surface Science 157, 256-262 (2000) [PDF]

    (7) R. Shiklera and Y. Rosenwaksb (2000) Near-field surface photovoltage Applied Physics Letters 77 ,836-838 (2000)

    (6) 5. R. Shikler, T. Meoded, N. Fried, N. Ashkenazy, and Y. Rosenwaks (1999) Novel application of Kelvin force microscopy J. Elec. Mater. 28, 1024 (1999) [PDF]

    (5) R. Shikler, T. Meoded, N. Fried, B. Mishori, and Y. Rosenwaks (1999) Two-dimensional surface band structure of operating light emitting devices Journal of Applied Physics 86, 107-113 (1999) [PDF]

    (4) T. Meoded, R. Shikler, N. Fried, and Y. Rosenwaks (1999) Direct measurement of minority carriers diffusion length using Kelvin probe force microscopy Applied Physics Letters 75, 2435 - 2437 (1999) [PDF]

    (3) R. Shikler, T. Meoded, N. Fried, and Y. Rosenwaksa (1999) Potential imaging of operating light-emitting devices using Kelvin force microscopy Applied Physics Letters 77, 2972 - 2974 (1999) [PDF]

    (2) R. Shikler, N. Fried, T. Meoded, and Y. Rosenwaks (1999) Measuring minority-carrier diffusion length using a Kelvin probe force microscope Phys. Rev. B 61, 11041-11046 (2000) [PDF]

    (1) R. Shikler, M. Heiblum, and V. Umansky (1996) Spatial correlation of ionized donors and its effect on scattering time and spin splitting in a two-dimensional electron gas. Phys. Rev. B 55, 15427-15430 (1997) [PDF]

Papers in Hebrew


    (1) Korzov M., Shikler R. and Andelman D. (2008) Conducting Polymers: The New Generation of Plastic Electronics Galileo (Jan. 2008)

Book Chapters


    (2) Shikler R. - "Electronic surface properties of semiconductor surfaces and interfaces" In Kelvin probe force microscopy, Sascha Sadewasser and Thilo Glatzel Ed. Springer series in surface science (2012)

    (1) Y. Rosenwaks and R. Shikler, "Nanoscale Electronic Measurements of Semicondcutors using Kelvin Probe Force Moicroscopy", NATO Science Series II: Mathematics, Physics, and Chemistry. Vol 186 2004.

Conference Papers


    (7) Ma'yan Rumbak, Rafi Shikler, Iris Visoly Fisher, "Light trapping in P3HT:PCBM solar cells: Towards Improved Spectrum Utilization" Sede Boker Symposium on Solar Energy 2013.

    (6) S. Linde and R. Shikler "Degradation study of a polyfluorene F8BT: understanding organic solar cell degradation of the individual component" Sede Boker Symposium on Solar Energy 2011.

    (5) R. Shikler "Modeling the effect of the structure of polymer photocells on their absorption spectrum" IEEEI 2008 Eilat, Israel

    (4) R. Shikler and R. H. Friend "Modeling the effect of the structure of polymer photocells on their absorption spectrum" Sede Boker Symposium on Solar Energy 2009.

    (3) R. Shikler, G. Lubarsky, and Y. Rosenwaks, "Nanometer Characterization of Semiconductors Using Kelvin probe Force Microscopy", Proc. 9th Sde Boker Symposium on Solar Electricity Production, Sde Boker July 1999.

    (2) T. Meoded, R. Shikler, and Y. Rosenwaks, "Direct Measurement of Minority Carrier Transport using Atomic Force Microscopy", STM 99, Seoul 1999.

    (1) R. Shikler, T. Meoded, N. Fried, and Y. Rosenwaks, "Potential Imaging of Operating Light- Emitting Diodes using Kelvin Force Microscopy", STM 99, Seoul 1999.